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New Application Spotlight

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Our newest offering, the VeraFlex™ Materials Metrology System, provides direct measurement of thickness and composition of advanced ultra-thin films and device structures. VeraFlex is quickly becoming recognized as the materials metrology tool of choice for leading edge production, filling the growing gaps left by traditional optical techniques.

To support the growing need for advanced metrology solutions for flash and DRAM storage cells, ReVera offers a full suite of VeraFlex applications specifically targeted at emerging technology challenges where tighter compositional control is critical for yield improvement. These applications address a broad range of high K, metallization and implant processes, and have been successfully deployed at leading memory manufacturers.