| Date |
Title |
| July 12, 2007 |
ReVera Increases Flash Memory and DRAM Metrology System Market Share
Multiple VeraFlex tools enabling development and inline production of advanced memory devices with additional systems shipping over next quarter |
| March 15, 2007 |
ReVera Names Alain Harrus to Board of Directors
Semiconductor industry veteran boosts executive bench at materials metrology company |
| March 5, 2007 |
ReVera Announces Follow-on Purchase of the VeraFlex™ Materials Metrology System by SMIC
Second ReVera metrology system to be deployed in Shanghai Fab 8 to facilitate process transfer and rapid production ramping |
| December 6, 2006 |
ReVera Announces Purchase of the VeraFlex™ Metrology System by Toshiba
Expanded deployment of comprehensive materials metrology capabilities enables faster development and higher production yield |
| September 7, 2006 |
ReVera Announces Purchase of the VeraFlex™ Metrology System by the Crolles2 Alliance
System to be used to enable rapid development of 45nm processes and to provide additional capacity for 65nm production |
| July 31, 2006 |
ReVera Adds to its Executive Team
John Samuels and Jim Dodsworth join the company in marketing and sales leadership roles |
| June 19, 2006 |
ReVera to Exhibit at SEMICON West 2006
Company to highlight the latest advancements of its VeraFlex™ materials metrology system |
| April 24, 2006 |
ReVera Adds Experienced Executive to Lead its Asia Pacific Sales Organization
Scott Ritterbush joins the ReVera team as Director of Asia Pacific Sales |
| March 28, 2006 |
ReVera Announces Purchase of the VeraFlex™ Metrology System for 65nm In-Line Production Use
Flexible capabilities enable a leading microprocessor manufacturer to aggressively ramp production by controlling critical materials properties |
| December 1, 2005 |
ReVera Announces the VeraFlex Materials Metrology System
Flexible capabilities enable semiconductor producers to measure, monitor and control critical properties of emerging materials for 65 nm, 45 nm and beyond |
| October 10, 2005 |
ReVera Adds Sales Executive
Bryan Phelan Joins as Director of Sales |
| July 6, 2005 |
ReVera Announces zMAX
Non-Destructive Measurement Technology Speeds Introduction of Next Generation Transistors |
| June 21, 2005 |
ReVera Names Dr. Graham J. Siddall to Board of Directors |
| April 11, 2005 |
ReVera Enhances Leadership Team |
| March 25, 2005 |
ReVera Receives $11.2M in Series B Funding |
| July 7, 2004 |
ReVera Launches New High K Capacitor Metrology Solution for 65nm ALD Materials
In-Line Compositional Metrology Tool Expands Portfolio of Atomic-Scale Applications to ALD-deposited High K Capacitor Films |
| February 24, 2004 |
ReVera Completes Venture Funding Round |
