News Releases
ReVera Introduces Advanced Data Analysis & Recipe Creation System
QED shortens time to implement VeraFlex II recipes to control complex thin film applications
Santa Clara, Calif., June 20, 2011 – ReVera Incorporated, the Materials Metrology Company and leader in high–k metal gate metrology, today introduced its new QED off-line system for advanced data analysis and recipe creation. QED enhances productivity of the VeraFlex II, ReVera's widely adopted film thickness and materials control system.
"Our customers rely on us to control thickness and composition of their most critical and complex films ," noted Tom Larson, VP of Marketing. "With higher levels of recipe editing and data visualization, QED shortens the time to implement VeraFlex II recipes to control their films. QED also maximizes VeraFlex II production availability by empowering users to create recipes and analyze complex measurement data off-line."
QED is immediately available and is running in multiple leading edge semiconductor manufacturers. QED arrives fully installed on a high performance laptop, is bundled with a library of proven recipe templates, and includes training by ReVera's global team of applications experts.
About ReVera
ReVera Incorporated, the Materials Metrology Company, is a leader in high-k metal gate (HKMG) production metrology solutions for advanced semiconductor processing. Its products are used globally by device manufacturers to measure, monitor and control critical HKMG materials properties in high-volume production, and to enable rapid development and control of complex, new processes. ReVera systems set the standard for HKMG metrology applications including gate dielectrics, work function metals and metal gates, and are backed by a global network of support partners and an experienced staff of applications engineering, field service, sales and logistics personnel. Visit www.ReVera.com for more information.